press-new project
Lynn Barra
lbarra at cbema.org
Tue Nov 8 11:51:58 PST 1994
<<<<<< Attached TEXT file named "PR/94-064" follows >>>>>>
Accredited Standards Committee*
X3, Information Technology
NEWS RELEASE
Doc No.: PR/94-064
Reply To: Lynn Barra
lbarra at cbema.org
X3 Announces Approval of a New Project on
Text Methods for Card Durability Evaluation
Washington, D.C. , November 8, 1994 -- Accredited Standards Committee
X3, Information Technology announces the approval of a new project and
invites interested parties to participate. This standard is being developed
in Technical Committee X3B10-Identification Cards and Related Devices.
This proposed standard will address overall durability parameters for
ID cards and provide a means for card life evaluation. Physical durability
tests may include parameters for flexure, brittleness, chemical resistance,
and impact resistance.
An initial call for patents and other pertinent issues related to this
subject
is now being issued. Submit all correspondence to: X3 Secretariat, Attn.:
Lynn Barra, 1250 Eye Street NW, Suite 200, Washington, DC 20005.
For further information regarding X3B10 activities, contact Mr. Christopher
Dyball, chairman of X3B10, at (415) 969-4428 or 73530,423.
# # #
X3 Secretariat, 1250 Eye Street NW, Suite 200, Washington DC 20005
Telephone: (202)737-8888 FAX: (202)638-4922
[END]
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